Eléments de l'association
|
List of bibliographic references
Number of relevant bibliographic references: 1.Ident. | Authors (with country if any) | Title |
---|---|---|
000789 | Stoichiometry and absolute atomic concentration profiles obtained by combined Rutherford backscattering spectroscopy and secondary-ion mass spectroscopy: InAs nanocrystals in Si |
This area was generated with Dilib version V0.5.77. |